Telcert Meeting - October 2005

The IMS Application Profiling Guidelines are available from IMS Website:

http://www.imsglobal.org/ap/index.html

They explain well why and how to build an Application Profile based on IMS Specifications (These specifications are already well tested with the Telcert Test Suite: Learning Design, LIP, Metadata, Content Package, ePortfolio)

A first draft for EIfEL/EPICC ePortfolio Application Profile that is planned to be use for the ePortfolio Plugfest in Cambridge is available from:

http://www.eife-l.org/portfolio/ep2005/plugfest/firstscenario

New version of some tools will be published before the end of October:

- Schemaprof version 4 an new Schema Transform Tool Plugin (including new feature like Domain profiling and Additionnal constraints support)

http://iwm.uni-koblenz.de/schemaprof/

- CRT 2 (New feature : Schematron rules validation, support of EIfEL/EPICC ePortfolio Application Profile, support of Cedefop Europass CV Schema).

The last release of CRT, configure with all this features (plus HR-XML Resume and IMS LIP support) are available from EIfEL website at:

http://www.eife-l.org/publications/tools/applicationprofilingtools/crt/D21_CRT_Tool_v2.zip

- Test System 1.4 (The conformance test system will be updated shortly to support Application Profiling)

A new tutorial document done by Apple UK will be available shortly. It will explain simply and shortly the benefits and the usage of telcert tools and methodology.

EIfEL Team participants: Serge Ravet and Marc Van Coillie

For comments and question ask Marc Van Coillie: marc.van.coillie@eife-l.org